Multi-state device redundant systems with common-cause failures and one standby unit
- 1 January 1980
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 20 (4) , 411-417
- https://doi.org/10.1016/0026-2714(80)90583-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A 4-Unit Redundant System with Common-Cause FailuresIEEE Transactions on Reliability, 1979
- A 1-out-of-N:G System with Duplex ElementsIEEE Transactions on Reliability, 1979
- On common-cause failures—BibliographyMicroelectronics Reliability, 1978
- Literature survey on three-state device reliability systemsMicroelectronics Reliability, 1977