Range Distributions of Low Energy Ions in Silver and Copper
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (2) , 1066-1068
- https://doi.org/10.1109/tns.1983.4332453
Abstract
Range distributions of 1-5 keV Nitrogen ions in polycrystalline copper and silver substrates are measured and compared with available theories. The distribution consists of a surface localized peak, a shoulder/second peak and a long tail. The shoulder/ second peak and tail are well explained by theories, however, the surface localized peak is a new feature for which several mechanisms have been investigated.Keywords
This publication has 9 references indexed in Scilit:
- Computer studies of the reflection of light ions from solidsPublished by Elsevier ,2002
- Radiation-enhanced diffusion as a coating method for protection against corrosion and wearPhysica Status Solidi (a), 1981
- Differential sputtering and surface segregation: The role of enhanced diffusionJournal of Vacuum Science and Technology, 1981
- A Monte Carlo computer program for the transport of energetic ions in amorphous targetsNuclear Instruments and Methods, 1980
- Diffusion enhancement due to low-energy ion bombardment during sputter etching and depositionJournal of Applied Physics, 1980
- Helium ion reflection from platinumNuclear Instruments and Methods, 1980
- Distortion of depth profiles during sputteringNuclear Instruments and Methods, 1980
- The electronic and nuclear stopping of energetic ionsApplied Physics Letters, 1977
- Approximations and interpolation rules for ranges and range stragglingsRadiation Effects, 1970