Determination of penetration depths and analysis of strains in single crystals by white beam synchrotron X-ray topography in grazing Bragg-Laue geometries
- 1 April 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 40-41, 388-392
- https://doi.org/10.1016/0168-583x(89)91005-7
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Depth profiling of defects in epilayer semiconductor materials by using synchrotron x-radiation topographyJournal of Applied Physics, 1987
- X-ray topography of thin subsurface layersPhysica Status Solidi (a), 1985
- Grazing Bragg-Laue diffraction for studying the crystal structure of thin filmsPhysica Status Solidi (a), 1984
- Bragg-Laue diffraction in inclined geometryPhysica Status Solidi (a), 1984
- Photoeffect in X-ray grazing incidence diffractionPhysica Status Solidi (a), 1984
- Synchrotron-radiation plane-wave topography I. Application to misfit dislocation imaging in III-V heterojunctionsPhilosophical Magazine A, 1980
- X-ray total-external-reflection–Bragg diffraction: A structural study of the GaAs-Al interfaceJournal of Applied Physics, 1979
- Stereographic X-ray reflection topography of dislocations in zincJournal of Applied Crystallography, 1976
- Experimental techniques for observing dislocations by the Berg–Barrett methodActa Crystallographica Section A, 1968
- ‘seeing’ dislocations in zincPhilosophical Magazine, 1964