Buried metal layer enhanced infrared reflection absorption spectroscopy for photoreactions induced by synchrotron radiation on SiO2 surfaces
- 1 May 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 79-80, 422-427
- https://doi.org/10.1016/0169-4332(94)90448-0
Abstract
No abstract availableKeywords
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