Lorentzian contributions to x-ray lineshapes in Si(Li) spectroscopy
- 1 September 1992
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 21 (5) , 223-227
- https://doi.org/10.1002/xrs.1300210506
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Energy-dispersive measurements ofLα1andLlx-ray linewidthsPhysical Review A, 1992
- Improved model for the intensity of low-energy tailing in Si(Li) x-ray spectraX-Ray Spectrometry, 1991
- X-ray spectrometers for PIXENuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Complete characterization of a Si(Li) detector in the photon energy range 0.9–5 keVReview of Scientific Instruments, 1989
- Analytic description of Si(Li) spectral lineshapes due to monoenergetic photonsX-Ray Spectrometry, 1987
- A semi-empirical model for the X-ray Si(Li) detector response functionNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- Treatment of the Si(Li) detector response as a probability density functionNuclear Instruments and Methods in Physics Research, 1982
- Natural widths of atomic K and L levels, Kα X-ray lines and several K L L Auger linesJournal of Physical and Chemical Reference Data, 1979