A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy
- 1 January 2001
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 78 (1) , 123-125
- https://doi.org/10.1063/1.1335546
Abstract
Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency shift Δf and tip–sample force gradient kts that simplifies the calculation of FMAFM images is established: Δf is a convolution of kts with a semispherical weight function.Keywords
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