Comparison between Californian and cyclotron SEU tests
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2383-2387
- https://doi.org/10.1109/23.45452
Abstract
Experimental equipment for performing heavy-ion testing on programmable integrated circuits is presented. The equipment was used along with two different types of heavy-ion simulator to perform SEU (single-event-upset) tests on representative circuits: a dedicated Cf/sup 252/ fission decay source and an 88-in cyclotron. The observed discrepancies between the two results obtained cast doubt on the validity of using californium sources to simulate high-LET (linear-energy-transfer) particlesKeywords
This publication has 2 references indexed in Scilit:
- A Comparison of Heavy Ion Sources Used in Cosmic Ray Simulation Studies of VLSI CircuitsIEEE Transactions on Nuclear Science, 1984
- Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test DataIEEE Transactions on Nuclear Science, 1983