Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
- 1 January 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (6) , 4520-4525
- https://doi.org/10.1109/TNS.1983.4333164
Abstract
A summary of the data on single event upset (bit flips) for sixt-y device types, having data storage elements, that were tested by JPL through May, 1982, is presented. The data were taken from fifteen accelerator tests with both protons and heavier ions.Keywords
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