Secondary ion and electron yield measurements for surfaces bombarded with large molecular ions
- 1 February 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 108 (3) , 282-289
- https://doi.org/10.1016/0168-583x(95)01060-2
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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