An automated BIST approach for general sequential logic synthesis

This publication has 3 references indexed in Scilit:

• Circular self-test path: a low-cost BIST technique
  Published by Association for Computing Machinery (ACM) ,1987
• Built-in Self Testing of Embedded Memories
  IEEE Design & Test of Computers, 1986
• Experiment to investigate self-testing techniques in VLSI
  IEE Proceedings G (Electronic Circuits and Systems), 1985