Quantitative analysis of REELS spectra of ZrO2: Determination of the dielectric loss function and inelastic mean free paths
- 1 July 1994
- journal article
- data interpretation-and-quantification
- Published by Wiley in Surface and Interface Analysis
- Vol. 22 (1-12) , 124-128
- https://doi.org/10.1002/sia.740220130
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- Dielectric loss function of Si and SiO2 from quantitative analysis of REELS spectraSurface and Interface Analysis, 1993
- Model for quantitative analysis of reflection-electron-energy-loss spectraPhysical Review B, 1992
- Quantitative analysis of reflection electron energy‐loss spectraSurface and Interface Analysis, 1992
- Ar-ion bombardment effects onsurfacesPhysical Review B, 1992
- Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and PdPhysical Review B, 1991
- Kramers-Kronig analysis of reflection electron-energy-loss spectra measured with a cylindrical mirror analyzerPhysical Review B, 1989
- Reflection electron-energy-loss investigation of the electronic and structural properties of palladiumPhysical Review B, 1984
- Is there a universal mean-free-path curve for electron inelastic scattering in solids?Journal of Electron Spectroscopy and Related Phenomena, 1981
- Electronic Excitations in Some Transition Metals and Their Oxides. Characteristic Energy Loss Measurements up to 50 eVPhysica Status Solidi (b), 1980
- Frequency- and Wave-Vector-Dependent Dielectric Function for SiliconPhysical Review B, 1972