High resolution X-ray imaging using amorphous silicon flat-panel arrays
- 1 June 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 46 (3) , 457-461
- https://doi.org/10.1109/23.775562
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Large-area 97-μm pitch indirect-detection active-matrix flat-panel imager (AMFPI)Published by SPIE-Intl Soc Optical Eng ,1998
- Large-area low-noise amorphous silicon imaging systemPublished by SPIE-Intl Soc Optical Eng ,1998
- Amorphous Semiconductors Usher in Digital X-Ray ImagingPhysics Today, 1997
- Amorphous Silicon Photodiode-Thin Film Transistor Image Sensor with Diode on Top StructureMRS Proceedings, 1997
- Two Dimensional Amorphous Silicon Image Sensor ArraysMRS Proceedings, 1995