Magnetoreflectance and magnetization of the Co-based wurtzite-structure diluted magnetic semiconductor Se
- 15 June 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (23) , 13298-13306
- https://doi.org/10.1103/physrevb.45.13298
Abstract
Magnetoreflectance measurements of excitonic interband transitions in the wurtzite-structure compound Se with various directions of applied magnetic field combined with magnetization measurements, allowed us to determine the ion-carrier exchange parameters for the conduction and valence bands (α=258±10 meV, β=-1883±30 meV), without making any assumption concerning the band parameters. The magnitude of these exchange parameters, compared with the values previously obtained for Se and Se, indicates a small variation of the conduction-band exchange parameter, but an important enhancement of the valence-band exchange parameter. This large variation of the hybridization-induced exchange is explained within a generalized Schrieffer-Wolff formula.
Keywords
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