Magnetoreflectance and magnetization of the Co-based wurtzite-structure diluted magnetic semiconductor Cd1xCoxSe

Abstract
Magnetoreflectance measurements of excitonic interband transitions in the wurtzite-structure compound Cd1x CoxSe with various directions of applied magnetic field combined with magnetization measurements, allowed us to determine the ion-carrier exchange parameters for the conduction and valence bands (N0α=258±10 meV, N0β=-1883±30 meV), without making any assumption concerning the band parameters. The magnitude of these exchange parameters, compared with the values previously obtained for Cd1x FexSe and Cd1x MnxSe, indicates a small variation of the conduction-band exchange parameter, but an important enhancement of the valence-band exchange parameter. This large variation of the hybridization-induced exchange is explained within a generalized Schrieffer-Wolff formula.