A novel SEM with spin polarization analysis
Open Access
- 31 December 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 51, 315-320
- https://doi.org/10.1016/0368-2048(90)80163-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPEJournal of Microscopy, 1985
- Spin-Polarized Scanning Electron Microscope for Magnetic Domain ObservationJapanese Journal of Applied Physics, 1985
- Observation of magnetic domains with spin-polarized secondary electronsApplied Physics Letters, 1984