Comparison of atomization processes: Trace element analysis using Ris of laserirradiated and ion-bombarded biological and metal surfaces
- 1 January 1991
- book chapter
- Published by Springer Nature in Lecture Notes in Physics
- p. 165-173
- https://doi.org/10.1007/bfb0048367
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Comparison of sputter-initiated resonance ionization spectroscopy and laser atomization resonance ionization spectroscopy to localize tin-labeled deoxyribose nucleic acidJournal of Vacuum Science & Technology A, 1991
- Potential application of sputter-initiated resonance ionization spectroscopy for DNA sequencingAnalytical Chemistry, 1991
- An approach to the use of stable isotopes for DNA sequencingGenomics, 1991
- Sputter-initiated resonance ionization spectroscopy: A matrix-independent sub-parts-per-billion sensitive technique applied to diffusion studies in SiO2–InP interfacesJournal of Vacuum Science & Technology A, 1990
- Resonance ionization mass spectrometry of sputtered osmium and rhenium atomsAnalytical Chemistry, 1990
- Analysis of high purity solids by resonance ionization spectroscopyJournal of Crystal Growth, 1988
- Detection of sputtered neutrals by multi-photon resonance ionizationNuclear Instruments and Methods in Physics Research, 1983