A comparative study of induced damage after irradiation with swift heavy ions, neutrons and electrons in low doped silicon
- 2 December 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 146 (1-4) , 317-322
- https://doi.org/10.1016/s0168-583x(98)00473-x
Abstract
No abstract availableKeywords
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