A framework for design and testing of analog integrated circuits
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (6) , 890-893
- https://doi.org/10.1109/19.65791
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- A rad-hard, low-noise, high-speed, BiFET charge preamplifier for the Superconducting SupercolliderPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Bridging the gap between design and testing of analog integrated circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Bridging the gap between design and testing of analog integrated circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Design of a very linear CMOS transconductance input stage for continuous-time filtersIEEE Journal of Solid-State Circuits, 1990
- Full-speed testing of A/D convertersIEEE Journal of Solid-State Circuits, 1984