Laser-induced back ablation of aluminum thin films using picosecond laser pulses
- 1 January 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (1) , 460-465
- https://doi.org/10.1063/1.369393
Abstract
A study of laser-induced back ablation of aluminum thin film targets with picosecond laser pulses is reported. Ablated plume edge velocities are studied as a function of film thickness, laser pulse width, and incident laser fluence. Edge velocity results are compared to a model of total transmitted fluence incident at the substrate/film interface. A model including laser-induced avalanche ionization and multiphoton ionization mechanisms in the substrate shows a transmitted fluence limit which is consistent with observed edge velocity limits.This publication has 9 references indexed in Scilit:
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