Photoscanning of CdTe detectors for investigation of crystal quality and contact behaviour
- 1 January 1977
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 12 (2) , 349-353
- https://doi.org/10.1051/rphysap:01977001202034900
Abstract
N and P-type semi-insulating cadmium telluride crystals have been scanned with a 6 328 A laser beam performing a TV-type scan. The current response from the sample under test has been determined as a function of different parameters : nature of the contacts, electric field, polarity. It is demonstrated that information can be obtained on the type of conductivity of the material, its homogeneity, the field distribution and the transport properties of electrons and holesKeywords
This publication has 4 references indexed in Scilit:
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- Simple Light Spot Scanner and Its Application on Semiconductor Nuclear Particle DetectorsReview of Scientific Instruments, 1967
- Observation of surface phenomena on semiconductor devices by a light spot scanning methodSolid-State Electronics, 1967