Model for failure rate curves
- 1 January 1979
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 19 (4) , 371-375
- https://doi.org/10.1016/0026-2714(79)90156-2
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Failure-rate as a function of time due to log-normal life distribution(s) of weak partsMicroelectronics Reliability, 1977