Failure-rate as a function of time due to log-normal life distribution(s) of weak parts

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1 January 1977

journal article
Published by Elsevier in Microelectronics Reliability

Vol. 16 (2) , 155-158
https://doi.org/10.1016/0026-2714(77)90416-4

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Results of A 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 1 test results and electrical failure analysis
Microelectronics Reliability, 1975