The effects of rapid thermal annealing on the properties of sputtered YBCO superconducting films

Publisher Website
Google Scholar
Abstract
The effects of rapid thermal annealing on the material and electrical properties of sputter deposited yttrium barium copper oxide (YBa2Cu3O7-x) superconducting films were investigated. Rapid thermal annealing increased the critical current density but decreased the critical transition temperature of the films. The maximum increase in critical current density, an order of magnitude, occurred at 800 degrees C, while no increase was observed at 700 degrees C, below the growth temperature of 735 degrees C, or at 900 degrees C. The increase in critical current density is due to a reduction in the density of misaligned grains as evidenced by a decreasing c-axis parameter and a decrease in the full width at half maximum (FWHM) of the (005) peak. The critical temperature decreased for all annealing times and temperatures above the growth temperature due, presumably, to oxygen effusion from the films.