Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy
- 1 August 1996
- journal article
- review article
- Published by Elsevier in Progress in Surface Science
- Vol. 52 (4) , 193-335
- https://doi.org/10.1016/0079-6816(96)00008-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- Maximum entropy analysis of the effects of elastic scattering on the reconstruction of depth profiles from angle‐dependent XPS measurementsSurface and Interface Analysis, 1994
- Inelastic Collisions of Fast Charged Particles with Atoms and Molecules—The Bethe Theory RevisitedReviews of Modern Physics, 1971