Simultaneous background subtraction and depth profile determination from AES/XPS measurements
- 1 August 1994
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 21 (8) , 537-545
- https://doi.org/10.1002/sia.740210805
Abstract
No abstract availableThis publication has 33 references indexed in Scilit:
- The depth distribution function in Auger/XPS analysisSurface and Interface Analysis, 1992
- Analytical expression describing the attenuation of Auger electrons and photoelectrons in solidsSurface and Interface Analysis, 1991
- Non‐destructive depth profiling through quantitative analysis of surface electron spectraSurface and Interface Analysis, 1989
- Comparison of electron attenuation lengths and escape depths with inelastic mean free pathsSurface and Interface Analysis, 1988
- Quantitative analysis of the inelastic background in surface electron spectroscopySurface and Interface Analysis, 1988
- Quantitative non‐destructive in‐depth composition information from XPSSurface and Interface Analysis, 1986
- Elastic and inelastic scattering of electrons reflected from solids: Effects on energy spectraPhysical Review B, 1985
- Design—the requirements of maintenanceIEE Proceedings A Physical Science, Measurement and Instrumentation, Management and Education, Reviews, 1984
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- A program for calculating relativistic elastic electron-atom collision dataComputer Physics Communications, 1971