A Vertically Rotating Double-Crystal X-Ray Spectrometer

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Abstract
A versatile double-crystal X-ray spectrometer has been developed for the precise measurement of X-ray diffraction line widths to tenths of seconds. The device can be employed in either the parallel or antiparallel arrangement for rocking curve studies and can also be used in anomalous X-ray transmission experiments with nearly perfect crystals. A detailed description of the instrument is given as well as some results concerning the Darwin theory of X-ray diffraction line widths and Borrmann effects.