Ion damage to silicon crystals inside an electron microscope

This publication has 15 references indexed in Scilit:

• Radiation induced defects in silicon at room temperature
  Physica Status Solidi (a), 1980
• Identification of Small Defects in Silicon
  Physica Status Solidi (a), 1979
• IDENTIFICATION OF SMALL DEFECT CLUSTERS IN PARTICLE-IRRADIATED CRYSTALS BY MEANS OF TRANSMISSION ELECTRON MICROSCOPY
  Published by Elsevier ,1978
• Observation of ion bombardment damage in silicon
  Philosophical Magazine, 1968
• Die Interpretation des elektronenmikroskopischen Beugungskontrastes von Einschlüssen nahe einer kräftefreien Folienoberfläche
  Physica Status Solidi (b), 1967
• Elektronenmikroskopie kleiner Fehlstellenagglomerate in bestrahlten Metallen II. Untersuchungen an neutronen‐ und ionenbestrahltem Kupfer sowie neutronenbestrahltem Nickel
  Physica Status Solidi (b), 1967
• Direct observation of radiation damage produced in copper, gold and aluminum during ion bombardments at low temperatures in the electron microscope
  Acta Metallurgica, 1966
• Conversion of crystalline germanium to amorphous germanium by ion bombardment
  Philosophical Magazine, 1965
• Ion damage to metal films inside an electron microscope
  Philosophical Magazine, 1961
• Struktur des amorphen Germaniums und Siliciums
  Zeitschrift für Naturforschung A, 1958