Electronic structure of amorphous Si measured by (e,2e) spectroscopy

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Abstract
Energy-resolved electron momentum densities are determined for a thin Si film evaporated onto a carbon foil. This is done by transmission (e,2e) spectroscopy, a technique that does not rely on crystal momentum and is therefore ideally suited for the study of amorphous materials. Spectra were collected with an energy resolution of 2 eV and a momentum resolution of 0.15 au (0.3 AA-1). The main feature disperses in a strikingly similar way to the crystalline ones. In addition to the dispersion the intensities of the peaks are obtained. In spite of having only a qualitative understanding of the shape of the spectra, the results of the comparison of measured amorphous momentum densities with calculated crystalline ones are reasonable. The basis of this agreement between amorphous solid and crystalline theory is discussed.