An XPS study of ion-induced dissociation on metal carbonate surfaces
- 1 October 1981
- Vol. 31 (10-12) , 513-517
- https://doi.org/10.1016/0042-207x(81)90051-8
Abstract
No abstract availableThis publication has 39 references indexed in Scilit:
- XPS studies of ion-bombardment damage of transition metal sulfidesJournal of Electron Spectroscopy and Related Phenomena, 1980
- The development of a general three‐dimensional surface under ion bombardmentPhilosophical Magazine A, 1980
- The development of surface shape during sputter‐depth profiling in Auger electron spectroscopySurface and Interface Analysis, 1980
- Quantitative secondary ion mass spectrometry: A reviewSurface and Interface Analysis, 1980
- Effect of ion bombardment conditions on the chemical profile through the surface of tinplateMaterials Science and Engineering, 1980
- Sputtering of single and multiple component materialsJournal of Vacuum Science and Technology, 1980
- The reduction of Pt(IV) to Pt(II) by X-ray and argon-ion bombardment; evidence from X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1980
- The sputtering process and sputtered ion emissionSurface Science, 1979
- The development of surface topography during depth profiling in auger electron spectroscopySurface Science, 1979
- X-ray photoelectron spectroscopic studies of nickel-oxygen surfaces using oxygen and argon ion-bombardmentSurface Science, 1974