Optimum defocus for stem imaging and microanalysis
- 31 December 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 21 (2) , 171-177
- https://doi.org/10.1016/0304-3991(87)90083-0
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- An illustrated review of various factors governing the high spatial resolution capabilities in EELS microanalysisUltramicroscopy, 1985
- Phase contrast imaging using a scanning transmission electron microscopeUltramicroscopy, 1984
- Coherent interference effects in SIEM and CBEDUltramicroscopy, 1981
- Scanning transmission electron microscopy of thin specimensUltramicroscopy, 1976
- Visibility of Single AtomsScience, 1970
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969