Drude parameters of liquid silicon at the melting temperature
- 23 November 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 51 (21) , 1747-1749
- https://doi.org/10.1063/1.98511
Abstract
The Drude parameters of liquid silicon at the melting temperature have been obtained from time-resolved reflectivity measurements at 1064, 532, and 355 nm following melting of an optically thick layer by a picosecond visible laser pulse. The ratio of the electron density N to the electron mass m is found to be equal to 2.17×1059 m−3 kg−1 and the relaxation time τ to be equal to 212 as. These values are compared to previous results obtained by cw ellipsometry between 1 and 0.4 μm and by nanosecond time-resolved ellipsometry of 632.8 nm.Keywords
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