A simple non-destructive method of measuring the thickness of transparent thin films between 10 and 600 nm
- 31 January 1968
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 11 (1) , 59-64
- https://doi.org/10.1016/0038-1101(68)90138-x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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