Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H+ and H− ion desorption

The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the ${\mathrm{H}}^{\mathrm{+}}$ and ${\mathrm{H}}^{\mathrm{-}}$ ion desorption yields as a function of photon energies around the $\mathrm{C}\text{(1s)}$ core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the $\mathrm{C}{\text{(1s)–σ}}^{*}(\mathrm{C–H})$ surface resonance which is enhanced in the ${\mathrm{H}}^{\mathrm{+}}$ ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.