A Statistical Model Including Parameter Matching for Analog Integrated Circuits Simulation
- 1 October 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 4 (4) , 621-628
- https://doi.org/10.1109/tcad.1985.1270162
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Video frequency active filters using balanced‐type NICsElectronics and Communications in Japan (Part II: Electronics), 1986
- Statistical Simulation of the IC Manufacturing ProcessIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- Experimental study of Gummel-Poon model parameter correlations for bipolar junction transistorsIEEE Journal of Solid-State Circuits, 1977
- Statistical analysis for practical circuit designIEEE Transactions on Circuits and Systems, 1975
- Statistical Circuit Design: Characterization and Modeling for Statistical DesignBell System Technical Journal, 1971