A method of examining selected areas of surfaces using replicas and the electron microscope
- 1 October 1954
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 5 (10) , 349-350
- https://doi.org/10.1088/0508-3443/5/10/302
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A specimen screening aperture for the electron microscopeJournal of Scientific Instruments, 1954
- A method of observing selected areas in electron and optical microscopesBritish Journal of Applied Physics, 1953
- A method for the electron and optical microscopic examination of identical areasBritish Journal of Applied Physics, 1952
- Replica techniques in electron microscopyBritish Journal of Applied Physics, 1951