Yield optimization for arbitrary statistical distributions: Part I-Theory
- 1 April 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 27 (4) , 245-253
- https://doi.org/10.1109/tcs.1980.1084809
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- On Interpolation of Functions of n VariablesPublished by Springer Nature ,2006
- Optimal centering, tolerancing, and yield determination via updated approximations and cutsIEEE Transactions on Circuits and Systems, 1978
- Yield estimation for efficient design centring assuming arbitrary statistical distributionsInternational Journal of Circuit Theory and Applications, 1978
- Idealized statistical models for low-cost linear circuit yield analysisIEEE Transactions on Circuits and Systems, 1977
- Regionalization: A method for generating joint density estimatesIEEE Transactions on Circuits and Systems, 1976
- A nonlinear programming approach to optimal design centering, tolerancing, and tuningIEEE Transactions on Circuits and Systems, 1976
- Optimization of design tolerances using nonlinear programmingJournal of Optimization Theory and Applications, 1974
- Interpolation in Several VariablesJournal of the Society for Industrial and Applied Mathematics, 1960
- Generalization of Concepts Related to Linear DependenceJournal of the Society for Industrial and Applied Mathematics, 1958