Phase transformation of crystallinity of Si1−xGex layers grown on Si(001) by low temperature molecular beam epitaxy
- 1 May 1995
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 150, 974-979
- https://doi.org/10.1016/0022-0248(95)80085-q
Abstract
No abstract availableKeywords
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