General transport theory of noise in p-n junction-like devices. IV. Terminal noise of p+-n diodes at high injection
- 16 June 1972
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 11 (2) , 653-667
- https://doi.org/10.1002/pssa.2210110229
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- General transport theory of noise in p–n junction-like devices. III. Junction noise in p+–n diodes at high injectionPhysica Status Solidi (a), 1972
- Boundary conditions at p-n junctionsSolid-State Electronics, 1971
- Noise sources in transport equations associated with ambipolar diffusion and Shockley-Read recombinationSolid-State Electronics, 1970
- G-R noise and admittance of double injection diodesPhysica, 1970
- Hole-electron product of pn junctionsSolid-State Electronics, 1967
- Static V-I relationships in transistors at high injection levelsIEEE Transactions on Electron Devices, 1966
- High injection theories of the p−n junction in the charge neutrality approximationSolid-State Electronics, 1966
- Shot and Thermal Noise in Germanium and Silicon Transistors at High-Level Current InjectionsProceedings of the IRE, 1960