Measurement of GaAs field-effect transistor electronic impulse response by picosecond optical electronics
- 1 November 1981
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 39 (9) , 739-741
- https://doi.org/10.1063/1.92875
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Picosecond photoconductivity in radiation-damaged silicon-on-sapphire filmsApplied Physics Letters, 1981
- Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductorsApplied Physics Letters, 1980
- A Josephson ultrahigh-resolution sampling systemApplied Physics Letters, 1980
- GaAs gigabit logic circuits using normally-off m.e.s.f.e.t.sElectronics Letters, 1980