Photoconductivity measurements in a-Si:H by frequency-resolved spectroscopy
- 30 December 1984
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 17 (36) , 6793-6799
- https://doi.org/10.1088/0022-3719/17/36/030
Abstract
The first experimental results of photoconductivity measurements in a-Si:H using in-phase and quadrature frequency-resolved spectroscopy (FRS) are reported. The main feature of the response curves of quadrature FRS is a double peak structure. The relative intensities of the peaks are strongly dependent on external parameters such as temperature and generation rate and on the Staebler-Wronski state, indicating the existence of two recombination mechanisms with different characteristic times.Keywords
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