Comparison of thin films ofYBa2Cu3O7−x deposited by physical (laser ablation) and chemical (OMCVD) methods for device applications
- 1 December 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 115 (1-4) , 31-42
- https://doi.org/10.1016/0022-0248(91)90709-e
Abstract
No abstract availableKeywords
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