Plasma Screening of Funnel Fields
Open Access
- 1 January 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 32 (6) , 4097-4103
- https://doi.org/10.1109/TNS.1985.4334075
Abstract
A plasma screening factor has been added to the McLean-Oldham effective funnel length model. Based on the skin depth concept, the factor is intended to provide for plasma screening of funnel fields in heavy-ion tracks crossing reverse-biased silicon and gallium arsenide junctions. Comparisons between screened-funnel predictions of prompt charge collection and experimental data show improved predictive accuracy at low and intermediate values of junction bias.Keywords
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