A Highly Efficient Redundancy Scheme: Self-Purging Redundancy
- 1 June 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-25 (6) , 569-578
- https://doi.org/10.1109/tc.1976.1674656
Abstract
The goals of this paper are to present an efficient redundancy scheme for highly reliable systems, to give a method to compute the exact reliability of such systems and to compare this scheme with other redundancy schemes. This redundancy scheme is self-purging redundancy, a scheme that uses a threshold voter and that purges the failed modules. Switches for self-purging systems are extremely simple: there is no replacement of the failed modules and module purging is quite simply implemented. Because of switch simplicity, exact reliability calculations re possible. The effects of switch reliability are quantitatively examined. For short mission times, switch reliability is the most important factor: self-purging systems have a probability of failure several times larger than the figure obtained when switches are assumed to be perfect. The influence of the relative frequency of the diverse types of failures (permanent, intermittent, stuck-at, multiple,...) is also investigated. Reliability functions, mission time improvements, and switch efficiency are computed and displayed. Self-purging systems are compared with other redundant systems, like hybrid or NMR, for their relative merits in reliability gain, simplicity, cost, and confidence in the reliability estimation. The high confidence in the reliability evaluation of self-purging systems makes them a standard for the validation of several models that have been proposed to take into account switch reliability. The accuracy of the models using coverage factors can be evaluated in this way.Keywords
This publication has 16 references indexed in Scilit:
- Reliability Modeling and Analysis of General Modular Redundant SystemsIEEE Transactions on Reliability, 1975
- Reliability Models of NMR SystemsIEEE Transactions on Reliability, 1975
- An Algorithm for the Accurate Reliability Evaluation of Triple Modular Redundancy NetworksIEEE Transactions on Computers, 1974
- Fault-Tolerance of the Iterative Cell Array Switch for Hybrid RedundancyIEEE Transactions on Computers, 1974
- Switch Complexity in Systems with Hybrid RedundancyIEEE Transactions on Computers, 1973
- An Iterative Cell Switch Design for Hybrid RedundancyIEEE Transactions on Computers, 1973
- Reliability modeling techniques for self-repairing computer systemsPublished by Association for Computing Machinery (ACM) ,1969
- FUNDAMENTALS OF THRESHOLD LOGICPublished by Elsevier ,1968
- A REDUNDANCY TECHNIQUE FOR IMPROVING THE RELIABILITY OF DIGITAL SYSTEMSPublished by Defense Technical Information Center (DTIC) ,1963
- The Use of Triple-Modular Redundancy to Improve Computer ReliabilityIBM Journal of Research and Development, 1962