Optical reflectometry with micrometer resolution for the investigation of integrated optical devices
- 1 April 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 25 (4) , 755-759
- https://doi.org/10.1109/3.17341
Abstract
An optical time-domain reflectometry (OTDR) system using an infrared subpicosecond pulse source in conjunction with balanced heterodyne detection is discussed. Experimental results show a density of more than 100 dB and a resolution of 60 mu m in air. Taking advantage of the large tuning range of the laser system, it is possible to improve the resolution to less than 10 mu m. The applicability of the OTDR system for the diagnostics of integrated optical devices is demonstrated for a simple GaAs waveguide structure.<>Keywords
This publication has 8 references indexed in Scilit:
- Optical coherence-domain reflectometry: a new optical evaluation techniqueOptics Letters, 1987
- Excess-noise suppression in a fibre-optic balanced heterodyne detection systemOptical and Quantum Electronics, 1986
- 200-femtosecond pulses at 106 μm generated with a double-stage pulse compressorOptics Letters, 1986
- 13-μ subpicosecond pulses from a dye laser pumped by compressed Nd:YAG-laser pulsesOptics Letters, 1986
- A dual-detector optical heterodyne receiver for local oscillator noise suppressionJournal of Lightwave Technology, 1985
- Accurate Range Gating Technique With Mode-Locked Dye LasersPublished by SPIE-Intl Soc Optical Eng ,1982
- CW autocorrelation measurements of picosecond laser pulsesIEEE Journal of Quantum Electronics, 1980
- Imperfectly Mode-Locked Laser Emission and Its Effects on Nonlinear OpticsPhysical Review B, 1969