The combinatorial design approach to automatic test generation
- 1 September 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Software
- Vol. 13 (5) , 83-88
- https://doi.org/10.1109/52.536462
Abstract
The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.Keywords
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