Image Intensification Techniques Applied to the Study of X-Ray Diffraction Pattens

Abstract
The usefulness of image intensifiers in the study of X-ray diffraction patterns has been demonstrated in a number of laboratories. Advantages arise from the fact that usable patterns can be obtained with a marked economy of X-ray exposure campared with conventional film recording or sequential diffractometer techniques, making possible the study of materials very susceptible to radiation damage and systems exhibiting dynamic characteristics which limit permissible dosage or exposure times. In addition, the reduction of time required for the recording of a pattern permits studies of families of crystals with large unit cell size containing many diffraction spots. Various X-ray sensitive cathode arrangements are described and compared. Image intensifiers and read-out techniques available are discussed. Results have been obtained for certain organic crystals demonstrating the capabilities of a system that has reduced the time required for certain exposures by a factor of several hundred.

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