Observation of the InP surface thermally cleaned in an arsenic flux using a scanning tunneling microscope
- 23 September 1991
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (13) , 1588-1590
- https://doi.org/10.1063/1.106294
Abstract
An InP surface thermally cleaned in an arsenic flux was observed using an ultrahigh-vacuum scanning tunneling microscope (UHV-STM). In the STM image, about 1.6 nm period lines of 0.8 nm width with two rows were observed along the [110] direction. This result suggests that the surface comprises two In-In dimers and two missing dimers per (4×2) cells.Keywords
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