TEM characterization of defects in LEC-grown GaAs substrates
- 1 April 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 110 (4) , 769-780
- https://doi.org/10.1016/0022-0248(91)90635-i
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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