Molecular structure and thickness of highly oriented poly(tetrafluoroethylene) films measured by atomic force microscopy
- 1 March 1993
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science
- Vol. 28 (5) , 1372-1376
- https://doi.org/10.1007/bf01191980
Abstract
No abstract availableKeywords
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