Array probe card

Publisher Website

2 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/mcmc.1992.201439

Abstract

No abstract available

Keywords

ARRAY PROBE CARD

This publication has 1 reference indexed in Scilit:

A fine pitch probe technology for VLSI wafer testing
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002