A fine pitch probe technology for VLSI wafer testing

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114110

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Very high density probing
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Membrane probe card technology (the future for higher performance wafer test)
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003